Atomic Data for Si
| Property | Value |
| Atomic Number: | 14 |
| Atomic Mass: | 28.085 |
| Density (gm / cm^3): |
2.329 |
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X-ray absorption edges for Si
| Edge |
Energy (eV) |
Width (eV) |
Fluorescence Yield |
Edge Jump |
| K |
1839.0 |
0.480 |
0.04291 |
10.370 |
| L1 |
149.7 |
1.030 |
0.00003 |
1.095 |
| L2 |
99.8 |
0.015 |
0.00037 |
1.000 |
| L3 |
99.2 |
0.014 |
0.00038 |
1.000 |
| M1 |
8.0 |
0.113 |
0.00001 |
1.000 |
| M2 |
2.0 |
0.001 |
0.00000 |
1.000 |
| M3 |
2.0 |
0.001 |
0.00000 |
1.000 |
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X-ray fluorescence lines for Si
| Line |
Energy (eV) |
Intensity |
| Ka1 (K - L3 ) |
1739.8 |
0.59069 |
| Ka2 (K - L2 ) |
1739.2 |
0.29652 |
| Ka3 (K - L1 ) |
1689.3 |
0.00015 |
| Kb1 (K - M3 ) |
1837.0 |
0.07420 |
| Kb3 (K - M2 ) |
1837.0 |
0.03844 |
| Lb3 (L1 - M3 ) |
147.7 |
0.58617 |
| Lb4 (L1 - M2 ) |
147.7 |
0.41383 |
| Ll (L3 - M1 ) |
91.2 |
1.00000 |
| Ln (L2 - M1 ) |
91.8 |
1.00000 |
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