IXAS X-ray Data for the Elements

Select Element for X-ray Properties

H He
Li Be B C N O F Ne
Na Mg Al Si P S Cl Ar
K Ca Sc Ti V Cr Mn Fe Co Ni Cu Zn Ga Ge As Se Br Kr
Rb Sr Y Zr Nb Mo Tc Ru Rh Pd Ag Cd In Sn Sb Te I Xe
Cs Ba La Hf Ta W Re Os Ir Pt Au Hg Tl Pb Bi Po At Rn
Fr Ra Ac
Ce Pr Nd Pm Sm Eu Gd Tb Dy Ho Er Tm Yb Lu
Th Pa U Np Pu Am Cm Bk Cf



Atomic Data for Si
 Property     Value 
  Atomic Number:   14
  Atomic Mass:   28.085
  Density (gm / cm^3):   2.329
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X-ray absorption edges for Si
  Edge     Energy (eV)     Width (eV)   Fluorescence Yield   Edge Jump
    K   1839.0   0.480   0.04291   10.370
    L1   149.7   1.030   0.00003   1.095
    L2   99.8   0.015   0.00037   1.000
    L3   99.2   0.014   0.00038   1.000
    M1   8.0   0.113   0.00001   1.000
    M2   2.0   0.001   0.00000   1.000
    M3   2.0   0.001   0.00000   1.000
X-ray fluorescence lines for Si
  Line     Energy (eV)     Intensity
    Ka1 (K - L3 )   1739.8   0.59069
    Ka2 (K - L2 )   1739.2   0.29652
    Ka3 (K - L1 )   1689.3   0.00015
    Kb1 (K - M3 )   1837.0   0.07420
    Kb3 (K - M2 )   1837.0   0.03844
    Lb3 (L1 - M3 )   147.7   0.58617
    Lb4 (L1 - M2 )   147.7   0.41383
    Ll (L3 - M1 )   91.2   1.00000
    Ln (L2 - M1 )   91.8   1.00000